The AFX Series consists of a range of High Power Switching AC, DC and AC+DC capable Power Sources covering a power range from 6 kVA to 180 kVA (1). All AFX models offer single, split and three phase output configurations. The AFX is a state-of-the-art design using the latest digital power conversion technologies. Power density is among the highest in the industry allowing 15 kVA/kW of power in only 4U (7″) of rack space.
Great emphasis has been placed on energy efficiency, ease of installation, and maximum power per cubic inch of rack space.
Control and operational features provide a high degree of application versatility and ease of use for the test engineer. Applications range from simple, manually controlled frequency conversion to harmonic immunity testing and sophisticated transient simulation.
Power conversion within the AFX Series is achieved by digitally controlled, high frequency pulse width modulation, resulting in cool, quiet and efficient operation. Some AFX models can be upgraded by customer service to provide higher power output using our POWER FLEX upgrade program.
The AFX series includes standard analog and digital I/O functions, scope function for voltage and current waveform capture, programmable output impedance and harmonic analysis measurements. Frequency range has been expanded to cover 1Hz through 3000Hz (with some power and voltage restrictions) and extended output voltage range to 333VLN / 576VLL.
Provides for exceptional accuracy of the AC or DC output Voltage. When enabled, accuracy improves to ±0.02% referenced to the power source internal voltmeter.
Create and execute transients that substitute a waveform in any or all phases for 1 to 100 cycles. The waveform being substituted can be selected and/or modified from the waveform library.
Create and execute transients that occur over a specified time segment to modify the output waveform, voltage, and frequency for any or all phases. An output trigger is provided for synchronizing external test equipment to the actual transient event.
More output current available at lower voltage setting without having to change range.
Up to 200 different waveforms can be stored in the waveform library for execution as part of a steady state program or for substitution in any output phase as part of a transient test program. Memory location #1 is a non-editable high resolution sine wave. Locations 2-127 are editable and can be substituted in any output phase. An unlimited number of waveforms may be stored on the computer using the available PPSC Manager Windows software.
DC, 15 to 1,200 Hz. Full Power
1 to 3,000 Hz with some restrictions
0 – 425 Vdc Constant Power Mode
Single (1), Split (2) and Three Phase (3)
0 – 300 Vrms L-N / 0-520 Vrms L-L Constant Power Mode
(0-333 Vrms L-N / 0 – 576 Vrms L-L AC output available up to 9kVA per unit, 45-100Hz)
Resistive -10 Ohm to +10 Ohm, Inductive 0 to 2 mH
All AFX models are designed for operation in 19 inch equipment racks. Models above 15 kVA require parallel operating of one AFX Master unit and one or more auxiliary no-controller (NC) units. Models 3180AFX through 31500AFX are available as cabinet systems with all internal input and output wiring, terminal blocks and parallel connections included.
Standard 19 inch rack. Slide rails are available as an option for all AFX units.
See model table above for panel or cabinet height.
Approximately 25 inch, from the front panel to the rear of the chassis.
Front forced air intake with rear exhaust. Automatic Fan Speed Control for low acoustic noise and extended fan life. The available energy saving sleep modes of the AFX result in low power consumption during idle periods and extend the life of the product.
Pacific’s line of Smartsource® AC Power Sources enable engineers to easily automate their testing by using industry standard software development environments. The AFX series offers standard Ethernet/LAN connectivity, a browser interface, LXI compliance (LAN extensions for Instruments) to ensure inter operability with other LXI instruments and IVI (Interchangeable Virtual Instrument) driver to speed up ATE test program development.
